High potential test
The type tests are performed on a selection of cards to test the design. Every
card produced undergoes a production test to verify that the card has been
designed correctly and that the card is safe. The tests are called “hipot” (high
potential) tests (see Figure 12.18 and Figure 12.19).
The test are performed in two steps to make sure that the channels that are
side by side on the card can withstand the high potential voltages.
1
The inputs of Channel 1, 3 and 5 are tested using a 1500 V RMS common
mode signal with signal negative attached to chassis ground and the inputs
of Channel 2, 4 and 6 all connected to chassis ground.
2
The inputs of Channel 2, 4 and 6 are tested using a 1500 V RMS common
mode signal with signal negative attached to chassis ground and the inputs
of Channels 1, 3 and 5 all connected to chassis ground.
-
+
ADC
Isolated channel
-
+
ADC
Isolated channel
Chassis
1500 V RMS
Chn 1, 3, 5
Chn 2, 4, 6
Figure 12.18:
Hipot testing Channels 1, 3 and 5
GEN3i
I3763-3.1 en HBM: public
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