MTIE & TDEV Results Exported to CSV
11.4.3 VeEX MTIE/TDEV Wander Analysis PC software
• Provides further post-processing of clock stability data, such as MTIE and TDEV for long-term tests
• Frequency offset calculation and removal for relative TIE analysis
• Standard and user-programmable masks
• PDF report generation
• Fully resizable window, to accommodate any screen size and provide detailed zoom levels
• Compact stand-alone Windows® software. It can be carried in the same USB memory as the TIE data. No
installation is necessary.
For added convenience, the software doesn’t need installation and can be stored on and run from the same USB stick
where the wander log files are being stored.
11.4.3.1 TIE Measurement Results
Click on the Open button to load the desired MTIE of Phase file and see the TIE behavior on the screen. Use the
Compare button to load a secondary trace for comparison purposes. Up to two traces can be displayed and analyzed
simultaneously.
RXT-6200_RXT6000e_Module_Manual
Page 187 of 387
Summary of Contents for RXT-6000e
Page 1: ......
Page 39: ...Rx Pattern Setup Go back to top Go back to TOC RXT 6200_RXT6000e_Module_Manual Page 39 of 387...
Page 48: ...Tx Interface Setup Tx Structure Setup Text Mode RXT 6200_RXT6000e_Module_Manual Page 48 of 387...
Page 61: ...RXT 6200_RXT6000e_Module_Manual Page 61 of 387...
Page 97: ...RXT 6200_RXT6000e_Module_Manual Page 97 of 387...
Page 199: ...RXT 6200_RXT6000e_Module_Manual Page 199 of 387...
Page 267: ...Event Log Go back to top Go back to TOC RXT 6200_RXT6000e_Module_Manual Page 267 of 387...
Page 327: ...Go back to top Go back to TOC RXT 6200_RXT6000e_Module_Manual Page 327 of 387...
Page 351: ...Go back to top Go back to TOC RXT 6200_RXT6000e_Module_Manual Page 351 of 387...