VeEX RXT-6000e, User Manual

Page: 142 / 387

following conditions:
“Hard” Failure (SF) condition – Loss of Signal (LOS), MS-AIS, BER > 1 x 10
-3
.
“Soft” Failure (SD) condition – Signal degradation when BER exceeds a predetermined threshold.
Normally over a provisioned range of 1 x 10
-5
to 1 x 10
-9
.
Tap the APS Testing icon to display the APS testing screen shown below.
Sensor:
Select the trigger that will initiate the APS measurement
The selections are LOS, LOF, SDH FAS, B1, MS-AIS, MS-RDI, MS-REI, B2, AU-AIS, AU-LOP, B3,
HP-RDI, HP-REI, TU-AIS, 2M-AIS, 2M-LOF, LSS and TSE (bit errors)
Switch Time Limit : Configurable in the range from 15ms to 200ms
Typically 50ms according to ITU-T recommendations
Gate Time : Configurable in the range from 50ms to 4 seconds
Used to measure total service disruption when multiple switches or micro interrupts occur
Repeat : ON/OFF
Configurable to measure on a continuous basis
Start : Press to begin the test
APS Timing Setup
APS Test Procedure:
The test set should be connected to a tributary port of network element or transmission system to ensure
that the switching time is measured for the service transported by the SDH network
Ensure that no errors or alarms are present on the transmission system because this will impact the
measurement
The measurement will be triggered depending on the condition configured
The test set measures how long the AIS event remains present after the event is first recognized and will
continue to measure the total disruption time in the event of multiple disruptions
RXT-6200_RXT6000e_Module_Manual Page 142 of 387