VeEX RXT-6000e, User Manual

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negative TIE recorded, (4) MTIE for the whole test data, (5) Y scale zoom level, (6) the last 600s of TIE values,
Start/Stop/Restart buttons, and Analysis button (if the built-in MTIE & TDEV Analysis option is loaded in the test set)
Results
Phase results are also presented as the difference in nanoseconds between the rise of the reference timing pulse and the
signal under test. It includes (1) Current timing or phase error (TE), Maximum time error recorded, (3) Minimum or
negative time error recorded, (4) Average time error (cTE) for the whole test.
The 600s graph is provided as a tool to confirm the settings and signals stability before running a long term test, so
time is not wasted in testing an unstable signal or with frequency offset. It also gives users a glance of the current
status of long term tests.
11.4.2.2 Built-in MTIE & TDEV Analysis (Optional)
This option enables the test set to analyze up to 72 hours’ worth of wander measurement data and compare it against
standard masks for a PASS/FAIL assessment, without the need for a PC. The test set may allow the analysis to be
performed while the test is still running for run-time verification. Longer test take a lot longer to be analyzed, so the
VeEX Wander Analysis PC Software is still recommended for tests longer than 24 hours.
Features:
• Provides further post-processing of clock stability data, such as MTIE and TDEV
• Frequency offset calculation and removal for relative TIE analysis
• Standard MTIE and TDEV masks can be selected
• MTIE and TDEV results and mask export to CSV for further report generation using spreadsheets
• Direct PDF report generation to USB
TIE Results
TIE Results
RXT-6200_RXT6000e_Module_Manual Page 185 of 387