EXFO FTB-1, Руководство пользователя

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Test Setup - Test Configurator, Timer, and System
120
FTB-700G/800 Series
BERT
Service Disruption
The Service Disruption Time (SDT) corresponds to the duration associated
to a defect that occurred in the network. For example a disruption that
occurs during a network switching from the active channels to the backup
channels or vice versa.
Note:
The service disruption measurements are cleared when changing the
criteria. Service Disruption is not available for
Multi-Pattern .

Defect allows to choose on which layer and defect the service
disruption time test will be performed. Choices depend on the
selected test path.
Layer Signal Defect
Interface OTN/SONET/SDH LOS
DSn LOS , BPV , EXZ
PDH LOS , CV
OTUk OTN AIS , BDI , BEI , BIAE , BIP-8 , IAE , LOF , LOM
ODUk OTN AIS , OCI , LCK , BDI , BIP-8 , BEI
OPUk OTN AIS , CSF
Section/RS SONET/SDH LOF-S/ RS-LOF , B1
Line/MS SONET/SDH AIS-L/MS-AIS , RDI-L/MS-RDI , REI-L/MS-REI , B2
STS/AU Path SONET/SDH AIS-P/AU-AIS , LOP-P/AU-LOP , RDI-P/HP-RDI , REI-P/HP-REI , B3 ,
UNEQ-P/HP-UNEQ
VT/TU Path SONET/SDH AIS-V/TU-AIS , LOP-V/TU-LOP , RDI-V/TU-RDI , REI-V/LP-REI , BIP-2 ,
UNEQ-V/LP-UNEQ
DS1 DSn AIS , OOF , RAI , Framing Bit , CRC-6
DS3 DSn AIS , OOF , Idle , RDI , F-Bit , C-Bit , P-Bit , FEBE
E1 PDH AIS , CRC-4 , E-Bit , LOMF , TS16 AIS , LOF , FAS , RAI , RAI MF
E4, E3, E2 PDH AIS, LOF, FAS, RAI
BER OTN, SONET/SDH, DSn/PDH Pattern Loss , Bit Error