PANNORAMIC® CONFOCAL RX 1.0
SCANNING MODES AND SETTINGS
MAY 13, 2021
77
FOR RESEARCH USE ONLY. NOT FOR USE IN DIAGNOSTIC PROCEDURES .
•
Focus frequency:
This value determines how many fields of views will pass before
the sample is refocused. This value should be selected depending on the
unevenness and size of the specimen.
•
Focus Exposure:
The exposure time during focusing, it can have three states:
o
Short
o
Normal
o
Long
Sample detection
This panel offers options for setting threshold and the selection of scannable areas.
Figure 62: Sample detection
•
Source
o
Brightfield preview
–
a normal type of illumination in the microscope for
scanning the slide. This option is recommended when scanning in Brightfield
mode.
o
Darkfield
–
sample detection is performed with transmitted Darkfield
illumination (for low-intensity samples).
o
Pre-scan
–
creates a fast FL preview image that is displayed in the Profile
Wizard window. Scanning process takes a couple of minutes only, and it
cannot be interrupted.
o
Pre-scan high-resolution
–
creates a High-Resolution fast FL preview image of
every FOV within the selected area (in single layer DAPI, with an illu mination
time of 20ms) that is displayed in the Profile Wizard window. Scanning process
takes a couple of minutes only and cannot be interrupted.
o
Pre-scan + high-resolution
–
creates a High-Resolution fast FL preview image
of every FOV within the selected area (in single layer DAPI, with an
illumination time of 20ms) that is displayed in the Profile Wizard window.
Scanning process is initiated with a simple Pre-Scan, the located sample with
auto threshold is selected, and finally, an HR Pre-Scan is launched.
