31
SLAU367P – October 2012 – Revised April 2020
Copyright © 2012–2020, Texas Instruments Incorporated
List of Figures
34-25. ADC12IFGR0 Register
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34-26. ADC12IFGR1 Register
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34-27. ADC12IFGR2 Register
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34-28. ADC12IV Register
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35-1.
Comparator_E Block Diagram
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35-2.
Comparator_E Sample-And-Hold
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35-3.
RC-Filter Response at the Output of the Comparator
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35-4.
Reference Generator Block Diagram
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35-5.
Transfer Characteristic and Power Dissipation in a CMOS Inverter and Buffer
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35-6.
Temperature Measurement System
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35-7.
Timing for Temperature Measurement Systems
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35-8.
CECTL0 Register
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35-9.
CECTL1 Register
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35-10. CECTL2 Register
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35-11. CECTL3 Register
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35-12. CEINT Register
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35-13. CEIV Register
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36-1.
LCD Controller Block Diagram
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36-2.
LCD Memory for Static and 2-Mux to 4-Mux Mode - Example for 160 Segments
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36-3.
LCD Memory for 5-Mux to 8-Mux Mode - Example for 160 Segments
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36-4.
Bias Generation
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36-5.
Example Static Waveforms
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36-6.
Example 2-Mux Waveforms
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36-7.
Example 3-Mux Waveforms
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36-8.
Example 4-Mux Waveforms
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36-9.
Example 6-Mux Waveforms
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36-10. Example 8-Mux, 1/3 Bias Waveforms (LCDLP = 0)
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36-11. Example 8-Mux, 1/3 Bias Low-Power Waveforms (LCDLP = 1)
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36-12. LCDCCTL0 Register
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36-13. LCDCCTL1 Register
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36-14. LCDCBLKCTL Register
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36-15. LCDCMEMCTL Register
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36-16. LCDCVCTL Register
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36-17. LCDCPCTL0 Register
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36-18. LCDCPCTL1 Register
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36-19. LCDCPCTL2 Register
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36-20. LCDCPCTL3 Register
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36-21. LCDCCPCTL Register
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36-22. LCDCIV Register
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37-1.
ESI Block Diagram
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37-2.
ESI Analog Front End AFE1 Block Diagram
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37-3.
ESI Analog Front End AFE2 Block Diagram
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37-4.
Excitation and Sample-And-Hold Circuitry
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37-5.
Analog Input Equivalent Circuit
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37-6.
Analog Front-End Output Timing
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37-7.
Analog Hysteresis With DAC Registers
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37-8.
Timing State Machine Block Diagram
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37-9.
Test Cycle Insertion
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37-10. Timing State Machine Example
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