Flash Registers
565
SPRUHE8E – October 2012 – Revised November 2019
Copyright © 2012–2019, Texas Instruments Incorporated
Internal Memory
5.4.2.13 ECC Test Address Register (FADDR_TEST)
Figure 5-107. ECC Test Address Register (FADDR_TEST)
31
24 23
3
2
0
Reserved
ADDR
Reserved
R-0
R/W-0
R-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-115. ECC Test Address Register (FADDR_TEST) Field Descriptions
Bit
Field
Value
Description
31-24
Reserved
Reserved
23-3
ADDR
Address for selected 64-bit data. User-configurable address bits of the selected data in
ECC test mode. Ignore the three least significant bits of the address and write the
remaining address bits in this field.
0-2
Reserved
Reserved
5.4.2.14 ECC Test Register (FECC_TEST)
Figure 5-108. ECC Test Register (FECC_TEST)
31
8
7
0
Reserved
ECC
R-0
R/W-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-116. ECC Test Register (FECC_TEST) Field Descriptions
Bit
Field
Value
Description
31-8
Reserved
Reserved
7-0
ECC
8-bit ECC for selected 64-bit data. User-configurable ECC bits of the selected 64-bit
data block in ECC test mode.
5.4.2.15 ECC Control Register (FECC_CTRL)
Figure 5-109. ECC Control Register (FECC_CTRL)
31
16
Reserved
R-0
15
2
1
0
Reserved
ECC_SELECT
ECC_TEST_EN
R-0
R/W-0
R/W-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-117. ECC Control Register (FECC_CTRL) Field Descriptions
Bit
Field
Value
Description
31-2
Reserved
Reserved
1
ECC_SELECT
ECC block select.
0
Selects the ECC block on bits [63:0] of bank data.
1
Selects the ECC block on bits [127:64] of bank data.
0
ECC_TEST_EN
ECC test mode enable.
0
ECC test mode disabled
1
ECC test mode enabled