Flash Registers
564
SPRUHE8E – October 2012 – Revised November 2019
Copyright © 2012–2019, Texas Instruments Incorporated
Internal Memory
5.4.2.10 Error Interrupt Flag Clear Register (ERR_INTCLR)
Figure 5-104. Error Interrupt Flag Clear Register (ERR_INTCLR)
31
16
Reserved
R-0
15
2
1
0
Reserved
UNC_ERR_
INT_CLR
SINGLE_ERR_
INT_CLR
R-0
R/W0-1
R/W0-1
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-112. Error Interrupt Flag Clear Register (ERR_INTCLR) Field Descriptions
Bit
Field
Value
Description
31-2
Reserved
Reserved
1
UNC_ERR_INT_CLR
Uncorrectable bit error interrupt flag clear. Writing a 1 to this bit will clear
UNC_ERR_INT_FLG. Writes of 0 have no effect.
0
SINGLE_ERR_INT_CLR
Single bit error interrupt flag clear. Writing a 1 to this bit will clear
SINGLE_ERR_INT_FLG. Writes of 0 have no effect.
5.4.2.11 Data High Test Register (FDATAH_TEST)
Figure 5-105. Data High Test Register (FDATAH_TEST)
31
0
FDATAH
R/W-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-113. Data High Test Register (FDATAH_TEST) Field Descriptions
Bit
Field
Value
Description
31-0
FDATAH
High double word of selected 64-bit data. User-configurable bits 63:32 of the selected data blocks
in ECC test mode.
5.4.2.12 Data Low Test Register (FDATAL_TEST)
Figure 5-106. Data Low Test Register (FDATAL_TEST)
31
0
FDATAL
R/W-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 5-114. Data Low Test Register (FDATAL_TEST) Field Descriptions
Bit
Field
Value
Description
31-0
FDATAL
Low double word of selected 64-bit data. User-configurable bits 31:0 of the selected data blocks in
ECC test mode.