Rohde & Schwarz SMM100A, Руководство пользователя

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Configuring the internal baseband source
R&S
®
SMM100A
149 User Manual 1179.1341.02 ─ 05
Irrespectively of the way they are created, you can load the externally generated
waveform files into the instrument via one of the available interfaces, e.g., USB or
LAN. Usually, the waveform file is saved on one of the network drives which are
accessible for the operating system.
Related settings
See:
●
Chapter 4.6.3, "ARB settings" , on page 152
Related step-by-step descriptions
See:
●
Chapter 4.6.4, "How to create, generate and play waveform files" , on page 162
●
Chapter 4.6.4.6, "How to define periodically repeating traces" , on page 171
●
Chapter 4.6.4.5, "How to manually create a waveform using tag file format" ,
on page 167
●
Chapter 4.6.4.7, "How to create a control list using tag file format" , on page 173
●
Chapter 4.6.4.8, "How to create a data list using tag file format" , on page 175
●
Chapter 4.6.4.9, "Editing waveform files, data and control lists" , on page 176
4.6.2.2 ARB test signals
The following test signals are available:
●
"Sine" test signal : Two sinewave signals with a selectable (but equal) number of
samples per period and equal frequencies. When the generation is triggered, the
number of samples per period, together with the frequency of the test signal, deter-
mine the ARB clock frequency: "Clock Frequency" = "Frequency" * "Samples per
Period".
Note: Because the resulting clock rate must not exceed the maximum ARB clock
rate (see data sheet), the number of sample values is automatically restricted
depending on the selected frequency.
The first sine signal is mapped on the I samples, the second on the Q samples.
The two signals differ by a selectable phase offset. For a
–
90 deg offset, the result
is a unit vector in the I/Q plane, rotating counter-clockwise and starting at I = 0, Q =
–
1. For a 0 deg offset, the I and Q samples are on the diagonal of a unit square (I(t)
= Q(t)).
Using the arbitrary waveform generator (ARB)