Quantum Data 881, User Manual

Page: 424 / 1144

82 Chapter 12 CEC Interactive Troubleshooting Environment (ITE)
Bit timing tests
You can set the timing of the logical 1 or logical 0 data bit as well as the start bit in such a
way to test the ability of the device under test to handle bit timings that are at the edge of
what is allowable. For example, a 1 bit’s low period can be within the range from 0.4 to 0.8
milliseconds. You can set the time for the low period and entire period. When you set this
timing using the commands described, it affects all 1 or 0 bits in all subsequent messages
sent out by the emulated device.
To test the bit timing through the command line:
1. Enter the following command to modify the timing of the 1 bits in a message.
CEC1:CECT:1BIT 0.4 2.1 //sets the low period of a one bit to 0.4
milliseconds and the total bit time to
2.1 milliseconds
2. Enter the following command to modify the timing of the 0 bits in a message.
CEC1:CECT:0BIT 1.5 2.25 //sets the low period of a zero bit to 1.5
milliseconds and the total bit time to
2.25 milliseconds
3. Enter the following command to modify the timing of the start bit in a message.
CEC1:CECT:SBIT 3.7 4.5 //sets the low period of a start bit to 3.7
milliseconds and the total bit time to
4.5 milliseconds