
DSP1611/17/18/27/28/29 DIGITAL SIGNAL PROCESSOR
Information Manual
JTAG Test Access Port
April 1998
11-6
DRAFT COPY
Lucent Technologies Inc.
11.3 Elements of the JTAG Test Logic
(continued)
11.3.2 The TAP Controller (continued)
It is very important in generating TAP input test signals to note that the actions resulting from a given state (such as
capture or shift) take place one clock cycle after the entry into that state. This requires one TCK cycle delay of the
TDI input bits with respect to the TMS input bits corresponding to the shift state. The timing diagram of
illustrates this point.
5-4131
Figure 11-3. Timing Diagram Example
Timing Description
The external controller drives TCK, TMS, and TDI (possibly through other devices). They all change state on the
falling edge of TCK. TDO is driven from the DSP and also changes on the falling edge of TCK. TMS and TDI are
strobed on the rising edge of TCK in the DSP, and the TAP Controller state changes just after the rising edge of
TCK.
shows two independent actions occurring: data parallel loaded into the test data register and shifted
out on TDO, and new data being shifted into the DSP test data register and then enabled to the parallel outputs of
TDR. In this example, the internal test data register is 4 bits long.
The sequence on TMS moves the TAP Controller through the states shown in
. In this case, the
sequence 010 . . . changes the controller from IDLE, to select DR SCAN, to capture DR, etc. At the end of the cap-
ture DR state, data is parallel loaded into the test data register. On the next falling edge of TCK now in the Shift-DR
state, the LSB is shifted out of the DSP on TDO. On the next rising edge of TCK, the new data starts to shift into
the DSP from TDI. (TDI changes on the falling edge of TCK and the DSP strobes TDI on the rising edge.) After
four shifts, the new data is lined up in the DSP and is parallel loaded to the TDR output on the falling edge of TCK
in the middle of the UPDATE DR state.
TCK
TMS
TDI
TAP
CONTROLLER
STATE
TDO
PARALLEL
OUTPUTS
OF TDR
0
1
0
0
0
0
0
1
1
0
LSB
MSB
1 0 1 0
TDR PARALLEL INPUTS
X
X
X
X
0
1
0
1
X
X
IDLE
DR
SCAN
SHIFT DR
EXIT
DR
UPDATE
DR
IDLE
CAPTURE
DR
NEW DATA =
Summary of Contents for DSP1611
Page 18: ...Chapter 1 Introduction...
Page 27: ...Chapter 2 Hardware Architecture...
Page 52: ...Chapter 3 Software Architecture...
Page 116: ...Chapter 4 Instruction Set...
Page 154: ...Chapter 5 Core Architecture...
Page 176: ...Chapter 6 External Memory Interface...
Page 208: ...Chapter 7 Serial I O...
Page 237: ...Chapter 8 Parallel I O DSP1617 Only...
Page 261: ...Chapter 9 Parallel Host Interface PHIF DSP1611 18 27 28 29 Only...
Page 275: ...Chapter 10 Bit I O Unit...
Page 284: ...Chapter 11 JTAG Test Access Port...
Page 306: ...Chapter 12 Timer...
Page 313: ...Chapter 13 Bit Manipulation Unit...
Page 325: ...Chapter 14 Error Correction Coprocessor DSP1618 28 Only...
Page 350: ...Chapter 15 Interface Guide...
Page 367: ...Appendix A Instruction Encoding...
Page 379: ...Appendix B Instruction Set Summary...
Page 381: ...aD extractz aS IM16 B 52 aD insert aS arM B 53 aD insert aS IM16 B 54 aD aS aaT B 55...
Page 437: ...Index...