Section 3: Functions and features
Model 2461 Interactive SourceMeter® Instrument Reference Manual
3-136
2461-901-01 A/November 2015
Run the test:
1. Press the
HOME
key.
2. Use 4-wire connections to connect the first resistor to the instrument.
3. Press the
OUTPUT ON/OFF
switch to turn the source on.
4. Verify that the instrument is set to Continuous Measurement. If necessary, hold the
TRIGGER
key for 2 s and select
Continuous Measurement
.
5. Observe the measurements. If the resistor is inside the limits set for Limit 1, L1PASS is displayed.
If the resistor is not within the limits, L1FAIL is displayed. If the resistor is in the limits set for
Limit 2, L2PASS is displayed. If the resistor is not within the limits, L2FAIL is displayed. An
example of a test that passed the L1 test but failed the L2 test is shown below.
6. Press the
OUTPUT ON/OFF
switch to turn the source off. Note that the limit indicators are
displayed until you turn limit testing off.
Figure 137: Limit test front-panel indicators
Set up a limit test using the remote interface
You can set up limit testing through a remote interface. There are several methods you can use to set
up the limit test:
•
Scripting (available with TSP only): Allows the most flexibility; you can set up the limit test as
needed.
•
Trigger model: Provides the best speed and throughput, using predefined trigger blocks to
simplify set up.
The following topics show examples using simple and complex limit and binning tests.
Resistor grading using limit testing
This limit test inspects multiple limits until the first failure is received. When a resistor fails, it is sorted
into the appropriate bin.
This example grades resistors into tolerance levels (for example, 20%, 10%, 5%, and 1%). A single
spot measurement is inspected against multiple limits, which tighten progressively around the same
nominal value. Since there is no reason to continue limit checking once the appropriate tolerance
level for a resistor-under-test is determined, this application will typically immediately bin the tested
resistors. The bit patterns assigned to the limits determine into which bin a resistor is placed.