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GE Analytical Instruments ©2010
138 of 226
DLM 74001-04 Rev. A
Chapter 6: Calibration and System Protocols
JP Protocol Worksheet
Company Name ____________________________
Date _________________________
Analyst Name ______________________________
Firmware Version ______________
Analyzer Serial Number ______________________
Standards Expiration Date _____________
Standards Set Lot No. ___________________________________
TOC Blank Average_____________________________________ (Line 1)
500 ppbC SDBS Average_________________________________ (Line 2)
SDBS Blank-Corrected Average ___________________________ (Line 3)
SDBS Average (Line 2) – TOC Blank Average (Line 1) = SDBS Blank-Corrected Average (Line 3)
Average Temperature-Corrected Conductivity of 29.4
μ
S/cm __________________ (Line 4)
Temperature __________________________________________________________ (Line 4)
RSD__________________________________________________________________ (Line 5)
Difference ____________________________________________________________ (Line 6)
Acceptance Criteria for JP Protocol TOC (Only):
TOC Blank Average
250 ppb
Blank-Corrected Average
450 ppb
Pass
Fail
OR
Acceptance Criteria for JP Protocol TOC and Conductivity:
TOC Blank Average
250 ppb
Blank-Corrected Average
450 ppb
Conductivity Difference
±
RSD
2%
Sample temperature is between15°C to 30°C
Pass
Fail
Содержание Sievers 500 RL
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Страница 66: ...GE Analytical Instruments 2010 66 of 226 DLM 74001 04 Rev A Chapter 3 Installation ...
Страница 152: ...GE Analytical Instruments 2010 152 of 226 DLM 74001 04 Rev A Chapter 7 Maintenance ...
Страница 170: ...GE Analytical Instruments 2010 170 of 226 DLM 74001 04 Rev A Chapter 8 Troubleshooting ...
Страница 177: ...Appendix A GE Analytical Instruments 2010 177 of 186 DLM 74001 04 Rev A Figure 51 Left Side Analyzer Dimensions ...
Страница 178: ...Appendix A GE Analytical Instruments 2010 178 of 186 DLM 74001 04 Rev A ...
Страница 185: ...Notes GE Analytical Instruments 2010 185 of 186 DLM 74001 04 Rev A 186 ...
Страница 186: ...Notes GE Analytical Instruments 2010 186 of 186 DLM 74001 04 Rev A 186 ...