3152B User Manual
Publication No. 980935 Rev. A
Table 6-27, PLL Tests – PM Phase Offset
DC Source
Error
Counter
Freq Setting
Amplitude
Limits
Phase Reading
Pass
Fail
10 kHz
2 V
320
°±
15
°
10 kHz
4.5 V
270
°±
15
°
10 kHz
-2 V
40
°±
15
°
10 kHz
-4.5 V
90
°±
15
°
Arbitrary Waveform
Memory Operation
This tests the integrity of the waveform memory. The waveform
memory stores the waveforms that are being generated at the output
connector and, therefore, flaws in the memory can cause distortions
and impurities in the output waveform.
Waveform Memory
Equipment: Distortion Analyzer, ArbConnection
Preparation:
1. Connect 3152B output to the distortion analyzer input.
Configure the 3152B as follows:
SCLK:
As required by the test
Waveform: Arbitrary
Amplitude: 5
V
Output: On
2. Using ArbConnection prepare and download the following
waveform:
Wavelength:
500 k points
Waveform: Sine
wave
SCLK 100
MS/s
Test Procedure
1. Perform Sine wave distortion. It should be less than 0.1 %.
Test Results
Pass
Fail
Modulated
Waveform
Operation
This tests the operation of the modulation circuits. It includes tests for
the various modulation functions: FM, AM, FSK, PSK, Frequency
Hopping, Amplitude Hopping, and Sweep. Since the modulation run
modes are common to all modulation functions, they are being tested
on the FM modulation function only.
6-24 Performance Checks
EADS North America Test and Services
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