Megger ADX15, User Manual

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Recommended Testing Sequence
To properly test assets and to establish effective condition assessment while minimizing insulation stress, the following
testing sequence is recommended when using Manual or Automatic mode. The approach involves conducting a series
of progressively rigorous tests. If a test failure occurs, testing should be halted and the data should be evaluated prior
to any continued testing.
The suggested testing sequence is:
1. Low-voltage RLC (resistance, inductance, and (optional) capacitance) test.
2. Megohm/insulation Resistance (IR), dielectric absorption (DA), and/or polarization index (PI).
3. HiPot (standard, ramp, or step).
4. Surge.
Android Navigation Bar
During the course of testing, or when setting up tests (such as editing a test configuration), the standard Android
navigation bar may appear at the bottom of the test screen. This is standard Android behavior that cannot be fully
eliminated in all applications of the ADX software.
To remove the navigation bar, click on the arrow icon as shown in the example below.
Fig 73: Removing the Android navigation bar from the screen display.
Failure Messages During Testing
If the software encounters failures during any testing process, it will display error messages to alert you to the failure.
Some messages will also provide options for re-testing, saving results, continuing with testing, or other options
depending on the test type and the mode used (manual, automatic, or sequenced).
Refer to “Error and Failure Messages List” in “Appendix A — Troubleshooting” for more information.
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Recommended Testing Sequence