129
FLIM Data Acquisition
Figure 114:
Beam Path Settings of LAS AF when using detectors for default image acquisition (1) and
internal FLIM detectors for intensity image acquisition (2)
6. Acquire an image by clicking the
Capture Image
image acquisition button or acquire a
stack by clicking the
Start
image acquisition button. The start and finish of the stack are
defined interactively. The stack image is automatically added to your LAS AF experiment.
16.1.1.2
External APDs
1. First, switch on the APDs
electrically.
2. Set
X1 Port
in
Beam Path Settings
in the working area to
---
(
).
Figure 115:
Acquiring the reference image using APDs
Summary of Contents for TCS SP8 SMD
Page 1: ...10 Living up to Life User Manual Leica TCS SP8 SMD for FCS FLIM and FLCS ...
Page 4: ...4 Copyright ...
Page 14: ...14 Contents ...
Page 18: ...18 Intended Use ...
Page 20: ...20 Liability and Warranty ...
Page 28: ...28 General Safety Notes ...
Page 32: ...32 Additional Notes on Handling the System ...
Page 44: ...44 System Overview and Properties ...
Page 60: ...60 SMD Components Figure 31 DSN 102 Dual SPAD Power Supply ...
Page 80: ...80 Safety Features ...
Page 102: ...102 Switching On the System ...
Page 116: ...116 LAS AF ...
Page 214: ...214 Changing the Specimen ...
Page 216: ...216 Changing the Objective ...
Page 238: ...238 Switching Off the System ...
Page 242: ...242 Repairs and Service Work ...
Page 244: ...244 Maintenance ...
Page 246: ...246 Disassembly and Transport ...
Page 248: ...248 Disposal ...
Page 254: ...254 Contact ...
Page 256: ...256 Recommended Literature ...
Page 266: ...266 Appendix Figure 225 Declaration of conformity ...
Page 268: ...268 Appendix ...
Page 269: ......