c
On the oscilloscope, select [Shift]
∆
Time, then select [Enter] to display the setup time
(
∆
Time(1)-(2)).
d
Adjust the pulse generator channel 1 Delay until the pulses are aligned according the
the setup time of the setup/hold combination selected, +0.0 ps or -100 ps.
Disregard the oscilloscope Period(2) value. The settings provided in this procedure
measure the period from falling edge to falling edge, which is not a valid measurement.
4
Select the clocks to be tested.
a
Select the clock field to be tested and then select the clock edges as indicated in the
table.
Clocks
J
↑
+ K
↑
+ L
↑ +
M
↑
b
Connect the rising edge clocks to the pulse generator channel 1 output.
c
Select Done to exit the Master Clock menu.
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition (logic analyzer)
3–37
Summary of Contents for 1670G Series
Page 20: ...1 12...
Page 116: ...Testing Performance Performance Test Record pattern generator 3 92...
Page 126: ...Calibrating and Adjusting To test the CAL OUTPUT ports 4 10...
Page 166: ...Exploded View of the Agilent 1670G series logic analyzer Replacing Assemblies 6 4...
Page 201: ...Theory of Operation The Oscilloscope Board 8 11...
