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Performance Test Record (continued)
Test
Settings
Results
Single-Clock,
Multiple-Edge
Acquisition
Disable pulse generator, channel 1
COMP (LED off)
Pass/Fail
All Pods, Channel 3
Setup/Hold Time
3.5/0.0 ns
J
↕
K
↕
L
↕
M
↕
_______
_______
_______
_______
Setup/Hold Time
-0.5/4.0 ns
J
↕
K
↕
L
↕
M
↕
_______
_______
_______
_______
All Pods, Channel 11
Setup/Hold Time
3.5/0.0 ns
J
↕
K
↕
L
↕
M
↕
_______
_______
_______
_______
Setup/Hold Time
-0.5/4.0 ns
J
↕
K
↕
L
↕
M
↕
_______
_______
_______
_______
Time Interval
Accuracy
Expected
Limits
Measured
409.60
µ
s
409.56
µ
s to 409.64
µ
s
_________
Testing Performance
Performance Test Record (logic analyzer)
3–87
Summary of Contents for 1670G Series
Page 20: ...1 12...
Page 116: ...Testing Performance Performance Test Record pattern generator 3 92...
Page 126: ...Calibrating and Adjusting To test the CAL OUTPUT ports 4 10...
Page 166: ...Exploded View of the Agilent 1670G series logic analyzer Replacing Assemblies 6 4...
Page 201: ...Theory of Operation The Oscilloscope Board 8 11...