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Performance Test Record (oscilloscope)
Performance Test Record (oscilloscope)
Test
Settings
Results
Self-Tests
Pass/Fail
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Input Resistance
Channel 1
Channel 2
50
Ω±
0.5
Ω
(49.5 to 50.5
Ω
)
1M
Ω±
10 K
Ω
(0.990 to 1.010 M
Ω
)
50
Ω
@ 20 mV/Div
1 M
Ω
@ 20 mV/Div
50
Ω
@ 200 mV/Div
1 M
Ω
@ 200 mV/Div
50
Ω
@ 1 V/Div
1 M
Ω
@ 1 V/Div
50
Ω
@ 4 V/Div
1 M
Ω
@ 4 V/Div
50
Ω
@ 20 mV/Div
1 M
Ω
@ 20 mV/Div
50
Ω
@ 200 mV/Div
1 M
Ω
@ 200 mV/Div
50
Ω
@ 1 V/Div
1 M
Ω
@ 1 V/Div
50
Ω
@ 4 V/Div
1 M
Ω
@ 4 V/Div
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Testing Performance
Performance Test Record (oscilloscope)
3–88
Summary of Contents for 1670G Series
Page 20: ...1 12...
Page 116: ...Testing Performance Performance Test Record pattern generator 3 92...
Page 126: ...Calibrating and Adjusting To test the CAL OUTPUT ports 4 10...
Page 166: ...Exploded View of the Agilent 1670G series logic analyzer Replacing Assemblies 6 4...
Page 201: ...Theory of Operation The Oscilloscope Board 8 11...