GE Power Management
LPS-D Line Protection System
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1 PRODUCT DESCRIPTION
1.7 SELF-TEST FEATURES
1
The components tested in the background are listed in Table 9–2: RUN-TIME BACKGROUND SELF-TESTS
on page 9–2. Testing of I/O hardware is done in the foreground, so that the processors know when a given
component or port is in use and therefore not available for testing. The components tested in the foreground
are listed in Table 9–3: RUN-TIME FOREGROUND SELF-TESTS on page 9–2. Some foreground tests are
performed every sample period, while others are performed less frequently.
As with background self-tests, any failed foreground test is repeated and must fail three consecutive times to
be considered a failure. Although not specifically a self-test, the trip circuit continuity monitoring is performed
as a foreground test. Refer to Section 1.5.13: TRIP CIRCUIT MONITOR on page 1–21.
The operator may initiate a visual-response test of the keypad and LCD display components. Refer to Chapter
4: ACCEPTANCE/PERIODIC TESTS for details.
1.7.3 CONTINUOUS MONITOR
The LPS-D relay includes a continuous monitor feature in addition to its self-test features. The continuous
monitor is intended to detect any LPS-D tripping units (Zone 2 or Zone 3 distance functions, 50G or 50 overcur-
rent functions) that are in the picked-up condition without a corresponding operation of the Fault Detector. If
such a condition occurs and persists for 1 second, the LPS-D relay will issue a non-critical alarm and log a con-
tinuous monitor event.
These continuous monitor alarm points can be found in Table 2–7: INDEX NUMBERS – scheme, recloser, &
programmable logic on page 2–54
.
The Index numbers used for the continuous monitor are as follows:
•
48 – Trip Circuit alarm
•
49 – Zone flags on alarm
•
50 – Overcurrent Alarm
•
51 – Unbalanced Current Detector alarm
They are assigned in the default settings as inputs to the non-critical alarm. These flags may also be used in
configurable logic or assigned to other alarm contacts if required.
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