
12-2
Standard Event Reports and SER
Date Code 20010625
SEL-311L Instruction Manual
Standard Event Report Triggering
The relay triggers (generates) a standard event report when any of the following occur:
v
Relay Word bit TRIP asserts
v
Programmable SEL
OGIC
®
control equation setting ER asserts
v
TRI
(Trigger Event Reports) serial port command executed
v
Output contacts OUT101–OUT107 and OUT201–OUT206 pulsed via the serial port or
front-panel
PUL
(Pulse output contact) command
Relay Word Bit TRIP
Refer to Figure 5.4. If Relay Word bits TRIP asserts to logical 1, an event report is
automatically generated. Thus, any condition that causes a trip does not have to be entered in
SEL
OGIC
control equation setting ER.
For example, SEL
OGIC
control equation trip setting TR is unsupervised. Any trip condition that
asserts in setting TR causes the TRIP Relay Word bit to assert immediately. The Relay Word bit
TRIP asserts, and an event report is automatically generated. Thus, any element in setting TR
does not have to be entered in SEL
OGIC
control equation setting ER.
Relay Word bits TRIP is usually assigned to an output contact for tripping a circuit breaker (e.g.,
SEL
OGIC
control equation setting OUT201 = TRIP).
TRIP87 also asserts Relay Word bit TRIP when high-speed tripping is enabled (EHST
r
1).
Programmable SEL
OGIC
Control Equation Setting ER
The programmable SEL
OGIC
control equation event report trigger setting ER is set to trigger
standard event reports for conditions other than trip conditions. When setting ER sees a logical 0
to logical 1 transition, it generates an event report (if the SEL-311L Relay is not already
generating a report that encompasses the new transition). The factory setting is:
ER = /B87L2 + /M2P + /Z2G + /51G + /51Q + /50P1 + /LOP
The elements in this example setting are:
B87L2
Block negative-sequence differential trip when asserted.
M2P
Zone 2 phase-distance element asserted.
Z2G
Zone 2 ground-distance element asserted.
51G
Residual ground current above pickup setting 51GP for residual ground
time-overcurrent element 51GT (see Figure 3.42).
51Q
Negative-sequence current above pickup setting 51QP for negative-
sequence time-overcurrent element 51QT (see Figure 3.43).
50P1
Phase current above pickup setting 50P1P for phase overcurrent
element 50P1.
LOP
Loss of potential (LOP) asserts.
Summary of Contents for SEL-311L
Page 6: ......
Page 8: ......
Page 26: ......
Page 54: ......
Page 144: ......
Page 216: ......
Page 252: ......
Page 302: ......
Page 338: ......
Page 480: ......
Page 484: ......
Page 486: ......
Page 502: ......
Page 532: ...12 28 Standard Event Reports and SER Date Code 20010625 SEL 311L Instruction Manual 4 ...
Page 552: ......
Page 554: ......
Page 574: ......
Page 576: ......
Page 596: ......
Page 602: ......
Page 628: ......
Page 656: ......
Page 662: ......
Page 664: ......
Page 688: ......
Page 700: ......
Page 716: ......
Page 722: ......
Page 734: ......