Rev.6.00 Oct.28.2004 page 573
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REJ09B0138-0600H
19.5.4
Reliability of Programmed Data
An effective way to assure the data retention characteristics of the programmed chips is to bake them at 150
°
C, then
screen them for data errors. This procedure quickly eliminates chips with PROM memory cells prone to early failure.
Figure 19-6 shows the recommended screening procedure.
Mount
Program chip and verify data
Bake chip for 24 to 48 hours at
125
°
C to 150
°
C with power off
Read and check program
Figure 19-6 Recommended Screening Procedure
If a series of programming errors occurs while the same PROM programmer is being used, stop programming and check
the PROM programmer and socket adapter for defects.
Please inform Renesas Technology of any abnormal conditions noted during or after programming or in screening of
program data after high-temperature baking.
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