Omron XPECTIA FZ3, User Manual

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2
Measurement
220 Precise Defect FZ3 Processing Items List Manual
2.
Set the detection parameters.
Setting item
Set value
[Factory default]
Description
Size X
4 to 64
[16]
Specify the X-axis size of defects/contamination to be
detected.The higher this value, the higher the degree of defects
for large defects. Specify in units of pixels.
Size Y
4 to 64
[16]
Specify the Y-axis size of defects/contamination to be
detected.The higher this value, the higher the degree of defects
for large defects.Specify in units of pixels.
Sampling
interval X 1 to 64
[2]
Specify the interval for creating elements along the X axis.The
smaller this value, the greater the defect detection performance,
but the slower the processing speed.Specify in units of pixels.
Sampling
interval Y 1 to 64
[2]
Specify the interval for creating elements along the Y axis.The
smaller this value, the greater the defect detection performance,
but the slower the processing speed.Specify in units of pixels.
Comparing
interval X 1 to 32
[10]
Set the number of neighboring elements compared with when the
degree of defect is calculated,For example, if the Sampling
interval X is set to 4 and the comparing interval X is set to 2,
comparison is with separate elements of 4 x 2 = 8 pixels along the
X axis.
Comparing
interval Y 1 to 32
[10]
Set the number of neighboring elements compared with when the
degree of defect is calculated,For example, if the sampling interval
Y is set to 4 and the comparing interval Y is set to 2, comparison is
with separate elements of 4 x 2 = 8 pixels along the Y axis.
Direction
●
X
(circumferential)
●
Y(radial)
●
Diagonal
Set the direction for detecting defects.
The smaller the direction setting count, the shorter the processing
time.
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