![Keysight Technologies B1505A Configuration Manual Download Page 8](http://html1.mh-extra.com/html/keysight-technologies/b1505a/b1505a_configuration-manual_1961941008.webp)
Keysight B1505A Configuration and Connection Guide
Contents
3 kV, 20 A, Capacitance Measurement for On-Wafer Lateral Device . . . . . . . . . . . . . 7-30
Add High Resolution Measurement (10 fA resolution with MPSMU or HPSMU)
Capability to 3 kV, 20 A, Capacitance Measurement for On-Wafer Lateral Device . . 7-33
3 kV, 40 A Measurement for On-Wafer Lateral Device. . . . . . . . . . . . . . . . . . . . . . . . . 7-35
3 kV, 500 A Measurement for On-Wafer Lateral Device. . . . . . . . . . . . . . . . . . . . . . . . 7-38
3 kV, 500 A, Capacitance Measurement for On-Wafer Lateral Device . . . . . . . . . . . . 7-40
3 kV, 500 A, High Voltage Medium Current Measurement for On-Wafer
Lateral Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-42
10 kV, 500 A Measurement for On-Wafer Lateral Device. . . . . . . . . . . . . . . . . . . . . . . 7-44
Configuration Examples for Vertical Device Measurement with Wafer Prober. . . . . . . . 7-46
3 kV, 20 A Measurement for On-Wafer Vertical Device . . . . . . . . . . . . . . . . . . . . . . . . 7-47
3 kV, 20 A, Capacitance Measurement for On-Wafer Vertical Device. . . . . . . . . . . . . 7-51
Add High Resolution Measurement (10 fA resolution with MPSMU or HPSMU)
Capability to 3 kV, 20 A, Capacitance Measurement for On-Wafer Vertical Device. . 7-54
3 kV, 40 A Measurement for On-Wafer Vertical Device . . . . . . . . . . . . . . . . . . . . . . . . 7-56
3 kV, 500 A Measurement for On-Wafer Vertical Device . . . . . . . . . . . . . . . . . . . . . . . 7-59
3 kV, 500 A, Capacitance Measurement for On-Wafer Vertical Device. . . . . . . . . . . . 7-60
3 kV, 500 A, High Voltage Medium Current Measurement for On-Wafer
Vertical Device. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-62
10 kV, 500 A Measurement for On-Wafer Vertical Device . . . . . . . . . . . . . . . . . . . . . . 7-64
GaN Current Collapse / Dynamic On-Resistance Measurement System
Non-Kelvin Connection with the N1259A Test Fixture for Package Device . . . . . . . . 7-66
Kelvin Connection with the N1259A Test Fixture for Package Device . . . . . . . . . . . . 7-68
Non-Kelvin Connection with Prober for On-Wafer Lateral Device . . . . . . . . . . . . . . . 7-70
Kelvin Connection with Prober for On-Wafer Lateral Device . . . . . . . . . . . . . . . . . . . . 7-72
Summary of Contents for B1505A
Page 3: ......
Page 9: ...1 Configuration Guide ...
Page 83: ...2 N1259A Connection Guide ...
Page 107: ...3 N1265A Connection Guide ...
Page 133: ...4 N1272A and N1273A Connection Guide ...
Page 149: ...5 Connection Guide for Wafer Prober and Your Own Test Fixture ...
Page 203: ...6 Accessory Dimensions ...
Page 219: ...7 Connection and Ordering Examples ...
Page 297: ......