Oxford Instruments Cypher SPM, User Manual

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Cypher SPM
User Guide
25.3 4.4.3 Image Refinement 188
25.4 4.5 Stopping Imaging 188
25.5 188
26 Contact mode imaging in air 189
27 Preparing for conductive AFM imaging on the standard scanner 190
27.1 Zeroing the ORCA sample bias signal 190
27.2 Preparing the sample 191
27.2.1 Install the sample on the scanner and connect the bias lead 192
27.3 Mounting the cantilever 192
28 Preparing for conductive AFM on the environmental scanner 193
29 Current imaging with conductive AFM 195
30 Workflows 198
30.1 Loading the cantilever and sample on a standard scanner 198
30.2 Loading the cantilever and sample on an environmental scanner 205
30.3 AC mode imaging in air with the standard scanner 214
30.4 AC mode imaging in air with the environmental scanner 214
Part VI: Shipping and Maintenance
31 Shipping or moving 217
31.1 A note on unpacking 217
31.2 Moving: what does it mean? 217
31.3 Instrument weight 218
31.4 Complete system shutdown 218
31.5 Scanner removal and packaging 218
31.6 Removing the enclosure top cover 222
31.7 Backpack removal and packaging 225
31.8 Chassis removal and packaging 227
31.9 Packaging the enclosure 233
31.10 View module removal and packaging 237
31.11 Packaging the accessories 240
31.12 Packaging computers and monitors 242
31.13 Weights and Dimensions 242
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