IEEE-488 Reference
3-103
3.19.17 :MSELect <name>
[:SENSe[1]]:RESistance:MSELect <name>
Select ohms measurement type
Parameters
<name> = NORMal
Normal resistance measurements
RESistivity
Resistivity measurements
Query
:MSELect?
Query ohms measurement type.
Description
This command is used to select the ohms measurement type. NORMal is used to make normal
resistance measurements, and RESistivity is used for resistivity (surface and volume) measure-
ments. See paragraph 3.19.18 to configure resistivity measurements.
3.19.18 :RESistivity commands
The following commands are used for resistivity measurements. If using the Model 8009 Resis-
tivity Test Fixture, the measurement type (surface or volume) is automatically sensed by the
Model 6517A through the safety interlock cable. Also, when using the Model 8009, you do not
need to use the :USER commands (:RSELect, :KSURface and :KVOLume).
For detailed information on resistivity measurements, refer to paragraph 2.7.2.
:FSELect <name>
[:SENSe[1]]:RESistance:RESistivity:FSELect <name>
Specify test fixture
Parameters
<name> = M8009
Model 8009 Resistivity Test Fixture
USER
User supplied test fixture
Query
:FSELect?
Query selected test fixture
Description
This command is used to specify which test fixture is being used for resistivity measurements.
M8009 specifies the Model 8009 test fixture. When using the Model 8009, the only parameter
that needs to entered is the sample thickness for volume resistivity (see next command).
Specify USER when using any other resistivity test fixture. When using this type of test fixture,
you will have to be enter the other parameters for resistivity measurements (see :USER com-
mands).
:STHickness <NRf>
[:SENSe[1]]:RESistance:RESistivity:STHickness <NRf>
Volume resistivity; specify sample thickness
Parameters
<NRf> = 0.0001 to 99.9999
Sample thickness in millimeters.
Query
:STHickness?
Query programmed sample thickness
Description
This command is used to specify the thickness (in millimeters) of the sample for volume resis-
tivity measurements. Sample thickness is not required for surface resistivity.
