Front Panel Operation
2-68
2.14.2 Configure Test Sequence
The CONFIGURE SEQUENCE menu is used to select and
configure a test sequences and is summarized in Table 2-20.
The top level of the menu is displayed by pressing CONFIG
and then SEQ.
General rules to navigate the menu levels are provided in
paragraph 2.3.5.
APPLICATIONS
This menu item is used to select the application:
DEV-CHAR:
Use this menu item to select and configure
one of the device characterization tests:
DIODE — Use this option to select and configure the Diode
Leakage Current Test. After selecting LEAKAGE-CURRENT,
you will be prompted to enter the start voltage, stop voltage,
step voltage and the delay. After entering these test parameters,
use the EXIT key to back out of the menu structure.
CAPACITOR — Use this option to select and configure the
Capacitor Leakage Current Test. After selecting LEAKAGE-
CURRENT, you will be prompted to enter the bias voltage,
number of readings, and the time interval. After entering
these test parameters, use the EXIT key to back out of the
menu structure.
CABLE — Use this option to select and configure the Cable
Insulation Resistance Test. After selecting INSULATION-
RESISTANCE, you will be prompted to enter the bias volt-
age, number of readings, and time interval. After entering
these test parameters, use the EXIT key to back out of the
menu structure.
RESISTOR — Use this option to select and configure the
Resistor Voltage Coefficient Test. After selecting VOLT-
AGE-COEFFICIENT, you will be prompted to enter the first
voltage, first delay, second voltage, and second delay. After
entering these test parameters, use the EXIT key to back out
of the menu structure.
RESISTIVITY:
Use this menu item to select and configure
one of the standard method resistivity tests or the alternating
polarity test:
NORMAL:
Use this menu item to select and configure one
of the standard method Resistivity Tests:
SURFACE — Use this option to select and configure the Sur-
face Resistivity Test. You will be prompted to enter the pre-
discharge time, bias voltage, bias time, measure voltage, mea-
sure time, and discharge time. After entering these test param-
eters, use the EXIT key to back out of the menu structure.
VOLUME — Use this option to select and configure the Vol-
ume Resistivity Test. You will be prompted to enter the pre-
discharge time, bias voltage, bias time, measure voltage, mea-
sure time, and discharge time. After entering these test param-
eters, use the EXIT key to back out of the menu structure.
ALT POLARITY:
Use this menu to select and configure the
Alternating Polarity Resistance/Resistivity Test. You will be
prompted to enter the offset voltage, alternating voltage, mea-
sure time, readings to discard, and readings to store. After en-
tering these test parameters, use the EXIT key to back out of
the menu structure. (See paragraph 2.14.1 for more details.)
SIR:
Use this menu item to select and configure the Surface
Insulation Resistance Test. After selecting SUR-INSUL-
RES-TEST, you will be prompted to enter the bias voltage,
bias time, measure voltage, and measure time. After entering
these test parameters, use the EXIT key to back out of the
menu structure.
SWEEP:
Use this menu item to select and configure one of
the sweep tests:
SQUARE-WAVE — Use this option to select and configure
the Square Wave Sweep Test. You will be prompted to enter
the high level voltage, time at the high level, low level volt-
age, and time at the low level. After entering these test pa-
rameters, use the EXIT key to back out of the menu structure.
STAIRCASE — Use this option to select and configure the
Staircase Sweep Test. You will be prompted to enter the start
voltage, stop voltage, step voltage, and the step time. After
entering these test parameters, use the EXIT key to back out
of the menu structure.
CONTROL
This menu item is used to select the trigger source that will
start the armed test. The SEQ key is used to arm the selected
test (see paragraph 2.14.3).
MANUAL: Use this option to select the manual trigger
source. Once the test is armed, it will start when the TRIG
key is pressed.
IMMEDIATE: Use this option to select the immediate trig-
ger source. The test will start as soon as it is armed.
LID-CLOSURE: Use this option to select the lid of the Model
8009 or 8002A test fixture as the trigger source. Once the test
is armed, it will start when the lid of the test fixture is closed.
GPIB: Use this option to select the GPIB trigger source.
Once the test is armed, it will start when the Model 6517A
receives a bus trigger (GET or *TRG). Note that the TRIG
key can instead be used to start the test.
EXTERNAL: Use this option to select the external trigger
source. Once the test is armed, it will start when the Model
6517A receives an external trigger via the EXT TRIG IN
connector. Note that the TRIG key can instead be used to
start the test.
