IEEE-488 Reference
3-155
3.25.20 :DISCard <NRf>
:TSEQuence:ALTPolarity:DISCard <NRf>
Specify number of readings to initially discard
Parameters
<NRf> = 0 to 9999
Number of readings to discard
Query
:DISCard?
Query number of discarded readings
Description
This command is used to specify the number of initial readings to discard for the Alternating
Polarity Resistance/Resistivity test.
3.25.21 :SPOints <NRf>
:TSEQuence:CLEakage:SPOints <NRf>
:TSEQuence:CIResistance:SPOints <NRf>
Parameters
<NRf> = 1 to Max Buffer Size
Number of points in test sequence
Query
:SPOints?
Query number of points
Description
This command specifies the number of measurement points for the following tests:
Capacitor Leakage Test
Cable Insulation Resistance Test
3.25.22 :SPINterval <NRf>
:TSEQuence:CLEakage:SPINterval <NRf>
:TSEQuence:CIResistance:SPINterval <NRf>
Parameters
<NRf> = 0 to 99999.9(sec)
Interval between measurement points
Query
:SPINterval?
Query interval
Description
This command specifies the time interval between measurement points for the following tests:
Capacitor Leakage Test
Cable Insulation Resistance Test
3.25.23 Test sequence programming example
The following QuickBASIC 4.5 program uses the CEC/KPC IEEE-488 interface card. The stair-
case sweep test will measure current at each voltage step. The test will sweep from 0V to 20V
in 2V steps. When the test is finished, the readings (which are stored in the buffer) are dumped
to the computer and then displayed on the CRT.
' Quick Basic 4.5, CEC/KPC card
'
'$INCLUDE: 'ieeeqb.bi'
CALL initialize(21, 0)
CLS
CALL send(27, "*RST", status%)
CALL send(27, ":CALC1:STAT OFF", status%)
CALL send(27, "*CLS", status%)
CALL spoll(27, KIspoll%, status%)
' Configure status model to SRQ on Buffer Full:
CALL send(27, "STAT:MEAS:ENAB 512", status%)
CALL send(27, "*SRE 1", status%)