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IEEE-488 Reference
3-154
3.25.15 :LTIMe <NRf>
:TSEQuence:SQSWeep:LTIMe <NRf>
Low level time; square wave sweep test
Parameters
<NRf> = 0 to 9999.9 (seconds)
Query
:LTIMe?
Query low level time
Description
This configuration command is used for the following tests:
Square Wave Sweep Test
This command is used to specify the low level time for the square wave sweep test.
3.25.16 :COUNt <NRf>
:TSEQuence:SQSWeep:COUNt <NRf>
Specify cycle count
Parameters
<NRf> = 1 to MAX/2 See table 2-22
Query
:COUNt?
Query cycle count
Description
This command is used to specify how many times to repeat the programmed square wave cycle.
3.25.17 :OFSVoltage <NRf>
:TSEQuence:ALTPolarity:OFSVoltage <NRf>
Specify offset voltage
Parameters
<NRf> = -1000 to 1000
Offset voltage
Query
:OFSVoltage?
Query offset voltage
Description
This command is used to specify the offset voltage for the Alternating Polarity
Resistance/Resistivity test.
3.25.18 :ALTVoltage <NRf>
:TSEQuence:ALTPolarity:ALTVoltage <NRf>
Specify alternating voltage
Parameters
<NRf> = -1000 to 1000
Alternating voltage
Query
:ALTVoltage?
Query alternating voltage
Description
This command is used to specify the alternating voltage for the Alternating Polarity
Resistance/Resistivity test.
3.25.19 :READings <NRf>
:TSEQuence:ALTPolarity:READings <NRf>
Specify number of readings to store
Parameters
<NRf> = 1 to MAXimum
Specify number of readings
DEFAULT
1
MAXimum
See table 2-22
MINimum
1
Query
:READings?
Query number of readings to store
Description
This command is used to specify the number of readings to store for the Alternating Polarity
Resistance/Resistivity test.