IEEE-488 Reference
3-67
3.13.3
:CALCulate3
This Calculate subsystem is used to configure and control the limit tests (LIMIT 1 test and LIM-
IT 2 test). See paragraph 2.19.6 for details on limit tests.
[:DATA] <n>
:CALCulate3:LIMit[1]:UPPer[:DATA] <n>
Specify upper LIMIT 1
:CALCulate3:LIMit[1]:LOWer[:DATA] <n>
Specify lower LIMIT 1
:CALCulate3:LIMit2:UPPer[:DATA] <n>
Specify upper LIMIT 2
:CALCulate3:LIMit2:LOWer[:DATA] <n>
Specify lower LIMIT 2
Parameters
<n> =
-9.999999e35 to +9.999999e35
Specify limit value
DEFault
Set specified upper limit to 1
Set specified lower limit to -1
MINimum
Set specified limit to -9.999999e35
MAXimum
Set specified limit to +9.999999e35
Query
:UPPer?
Query specified upper limit
:UPPer? DEFault
Query *RST default upper limit
:UPPer? MINimum
Query lowest allowable upper limit
:UPPer? MAXimum
Query largest allowable upper limit
:LOWer?
Query specified lower limit
:LOWer? DEFault
Query *RST default lower limit
:LOWer? MINimum
Query lowest allowable lower limit
:LOWer? MAXimum
Query largest allowable lower limit
Description
These commands are used to set the upper and lower limits for LIMIT 1 and LIMIT 2. The ac-
tual limit depends on which measurement function is currently selected. For example, a limit
value of 1
µ
is 1
µ
A for the amps function and 1
µ
C for the coulombs function. A limit value is
not range sensitive. A limit of 2 for volts is 2V on all measurement ranges.
:SOURce <NRf>
:CALCulate3:LIMit[1]:UPPer:SOURce <NRf>
Specify pattern; upper LIMIT 1 failure
:CALCulate3:LIMit[1]:LOWer:SOURce <NRf>
Specify pattern; lower LIMIT 1 failure
:CALCulate3:LIMit2:UPPer:SOURce <NRf>
Specify pattern; upper LIMIT 2 failure
:CALCulate3:LIMit2:LOWer:SOURce <NRf>
Specify pattern; lower LIMIT 2 failure
Parameters
<NRf> = 0 to 15
Specify digital pattern for output port
Query
:SOURce?
Query source value for specified limit
Description
These commands are used to specify which line(s) of the Digital Output Port will go true when
a limit test failure occurs. The first failure in the test sequence determines the digital output pat-
tern. Subsequent failures in the test sequence will not change the digital output pattern on the
output port. Each output line is assigned a decimal weight as follows:
Digital Output
Decimal Weight
Line #1
1
Line #2
2
Line #3
4
Line #4
8
