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IEEE-488 Reference
3-150
Query
:STARt?
Query stop voltage
Description
This configuration command is used for the following tests:
Diode Leakage Test
Staircase Sweep Test
This command is used to specify the start voltage for the specified test.
3.25.3
:STOP <NRf>
:TSEQuence:DLEakage:STOP <NRf>
Stop voltage; diode leakage test
:TSEQuence:STSWeep:STOP <NRf>
Stop voltage; staircase sweep test
Parameters
<NRf> = -100.0 to 100.0
Volts; 100V range
-1000 to 1000
Volts; 1000V range
Query
:STOP?
Query stop voltage
Description
This configuration command is used for the following tests:
Diode Leakage Test
Staircase Sweep Test
This command is used to specify the stop voltage for the specified test.
3.25.4
:STEP <NRf>
:TSEQuence:DLEakage:STEP <NRf>
Step voltage; diode leakage test
:TSEQuence:STSWeep:STEP <NRf>
Step voltage; staircase sweep test
Parameters
<NRf> =
-100.0 to 100.0
Volts; 100V range
-1000 to 1000
Volts; 1000V range
Query
:STEP?
Query step voltage
Description
This configuration command is used for the following tests:
Diode Leakage Test
Staircase Sweep Test
This command is used to specify the step voltage for the specified test.
3.25.5
:MDELay <NRf>
TSEQuence:DLEakage:MDELay <NRf>
Measure delay; diode leakage test
:TSEQuence:RVCoefficient:MDELay[1] <NRf>
Measure delay 1; resistor voltage coefficient test
:TSEQuence:RVCoefficient:MDELay2 <NRf>
Measure delay 2; resistor voltage coefficient test
Parameters
<NRf> = 0 to 99999.9 (Resistor voltage coefficient test)
Delay in seconds
0 to 10000 (Diode leakage test)
Delay in seconds
Query
:MDELay?
Query measure delay
Description
This configuration command is used for the following tests: Diode Leakage Test Resistor Volt-
age Coefficient Test
This command is used to specify the measure time for the specified test. Note that the Resistor
Voltage Coefficient Test uses two measure delays; delay 1 and delay 2.