Agilent Technologies B1542A, User Manual

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5- 16 Agilent B1542A User’s Guide, Edition 4
PLSDIV Test Definitions
PLSDIV DC IdVg SMU
IntegNum For E5260/E5270, this parameter is the coefficient used to
define the integration time or the number of averaging samples
for the current measurement. Integer. See Table 5-2.
For 4155/4156, this parameter is the number of averaging
samples if this value is positive, or the NPLC value if this value
is negative. Integer,
-
1023 to 1023. IntegNum=
-
1023 to
-
101
give the same result as IntegNum=
-
100. The NPLC means the
number of power line cycles for the current measurement.
HoldTime Hold time, in s. 0 to 655.35. 5 digits or 10 ms resolution.
DelayTime Delay time, in s. 0 to 655.35. 5 digits or 100
μ
s resolution.
InstType Type of DC source monitor. E526x, E527x, or FLEX415x.
E526x: for Agilent E5260A
E527x: for Agilent E5270B
FLEX415x: for Agilent 4155/4156
InstAddress GPIB address of the DC source monitor. Integer, 1 to 32.
DcSwitch Availability of the pulse/dc switch units. Yes (exists, DC IV
measurement connection will be made) or No (none).
SWAddress GPIB address of the 11713A switch controller. Integer, 1 to 32.
Test Output The following output parameters are displayed after the test.
VgSet Gate voltage, in V. SMU output value.
Vg Target gate voltage, in V.
Vdrain Drain voltage, in V. SMU output value.
Id Drain current, in A.
IdPerWg Drain current per unit gate width, in A/
μ
m. IdPerWg = Id / Wg