LSI Logic Confidential
6-17
Copyright © 2001, 2002 by LSI Logic Corporation. All rights reserved.
TDI
C7
I
Test data In. BST serial data chain input.
TMS
B6
I
Test mode select. Controls state of test access port
(TAP) controller.
TCK
D8
I
Test clock. Boundary scan test (BST) serial data
clock.
1. I - input, O - output, OD - open drain, PU - requires external pull-up resistor.
Table 6.1
DMN-8600 Pin Descriptions (Cont.)
Name
Pin No.
Type
1
Description