Digital Equipment DEC 3000 600 AXP, Service Information

Page: 106 / 461

MEMORY Diagnostic
Subtests
Table 4–9 lists the MEMORY diagnostic subtests and their
description.
Table 4–9 Memory Diagnostic Subtests
Subtests Test description
ALL Performs all tests
CELL Memory cell test
ADDR Address lines test
LLSC Load-locked/Store-conditional
INIT Zero all memory
? Provides a list of available diagnostics
Memory options are provided to modify any memory sub-test.
Default values are used when option inputs are invalid or exceed
their ranges. Table 4–10 lists the memory options and their
description.
Table 4–10 Memory Test Options
Option Default Description
-l:xxxxxxxx 002000000 (2
MB) Lower address
boundary
-h:xxxxxxxx Top of memory Upper address
boundary
-n:xx 0 Number of retries
1
-x[-] On Stops on an error
condition when set
to ON [OFF]
-i[-] On Initializes memory after
tests ON [OFF]
1
Must be a hexadecimal value
Error Reporting All reported errors contain a hexadecimal longword of data and
FRU code to identify the failing memory SIMM.
4–18