Keithley 6517B, Справочное руководство

Страница: 188 / 498

In this section:
Introduction ............................................................................ 10-1
Limits ...................................................................................... 10-1
Digital I/O ............................................................................... 10-6
Scanning .............................................................................. 10-10
Introduction
This section discusses limits tests, use of the digital I/O port, and internal and external scanning with
the Keithley Instruments Model 6517B Electrometer
Limits
Limit testing is available through the LIMITS menu, which is part of the main MENU (see Menu (on
page 2-18) for more information).
The LIMITS menu is used for the following operations:

To set and control the limit values that determine the PASS/FAIL and HI/LO status of subsequent
measurements

To set the digital output patterns that signify passing or failing limit checks

To enable/disable a binning strobe signal on digital output #4 for triggering a user-supplied device
handler
Since the logic sense of the digital output lines is programmable (high-true or low-true), this
discussion of limits uses the logical terms TRUE/FALSE and ON/OFF, rather than HIGH and LOW.
There are two sets of limits, each with high and low limit values. You can program and enable one or
both limit sets. With both sets enabled, the values can overlap of one set can be included in the other.
The only restriction is that, within the same set, the high limit must be greater than the low limit for a
valid test.
Section 10
Limits, digital I/O, and scanning