DS2 Docking Station
Appendix B
Version 9.1 (P/N: 17112798)
INDUSTRIAL SCIENTIFIC
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Glossary of Terms
Appendix
B
This appendix contains a glossary of terms that are used within this document.
Table B-1. Glossary of Terms
Item Definition
Bump Test
Also known as “Functional test,” a procedure that verifies that an
instrument is able to detect gas. A brief exposure of the monitor to a
known concentration of gas(es) for the purpose of verifying sensor
and alarm operation. It is not intended to be a measure of the accuracy
of the instrument.
Bump Test Event
An event in the DS2 Docking Station that will automatically perform
a bump test on a docked instrument.
Calibration
A test that is used to adjust an instrument to correct for inaccuracies.
A known gas concentration is used as a calibration standard to verify
and adjust the output of the instrument.
Calibration Event
An event in the DS2 Docking Station that will automatically perform
a calibration on a docked instrument.
Compact Flash
Removable storage cards that are efficient in terms of weight, size,
and durability. Often used in digital cameras, printers, and handheld
computers, and can be used for wireless access.
Contents Pane
The right frame of the DSSAC application that displays the details an
option that was selected in the navigation pane. For example, the
instruments contents pane displays a list of instruments that have been
configured in the Docking Station Network.
Diagnostic Test
A test to determine if a particular function on an instrument or IDS is
operating properly. Diagnostic tests are run on instruments as a part
of the iNet service to proactively determine if a malfunction exists.
Diagnostics Event
An event in the DS2 Docking Station that will automatically perform
diagnostic tests on a docked instrument or on an IDS. The results of
these tests are sent to iNet for analysis.
