Hioki IM7580, Instruction Manual

Page: 182 / 340

174
Checking Contact Defects and the Contact State (Contact Check Function)
7.1.3 Detecting OPEN During 2-terminal Measurement (HIGH-Z
Reject Function)
This function outputs a measurement terminal contact error when the measurement result is higher
than the set judgment reference. The error is output via the measurement screen and EXT I/O. This
error is output as Hi Z on the measurement screen. An error is detected when the measured value
exceeds the setting value.
See “8 External Control” (p. 195).
1
2
3
1
Press [SETUP] .
2
Press [CONTACT] tab.
Press [SWEEP] tab for the ANALYZER mode.
3
Press [Hi Z] .
4 5
4
Press [Hi Z] .
5
Select ON/OFF for the Hi Z reject function.
[OFF] Disables the Hi Z reject function.
[ON]
Enables the Hi Z reject function.
6
7
The numeric keypad
can be used for input.
6
Set the judgment reference value with

/

.
(With the numeric keypad, press [SET] .)
Settable range 1
Ω
to 10,000
Ω
[C]
Sets to the default value.
(Set to
10,000
Ω
.)
7
Press [EXIT] to close the setting screen.