GE LOGIQ E9, Service Manual

Page: 257 / 754

GE
D
IRECTION
5573152-100, R
EV
. 2 LOGIQ E9 S
ERVICE
M
ANUAL
Chapter 7 Diagnostics/Troubleshooting 7 - 55
7-5-8-10 I/O Board Tests (cont’d)
Name: I/O Board Pwr Supply Test
NOTE: Description: Compares all local I/O Board voltages to their specified values.
7-5-5 "Home" on
page 7-26
Run Time: 00:01
If this test failed:
1.) Replace the I/O Board.
Name: I/O Board GFI Voltage Test
Description: Compares all voltages on the GFI to their specified values. The GFI may not be working,
therefore the BEP cannot communicate with the Front End.
Run Time: 00:01
If this test failed:
1.) Verify that the BEP to Backplane cable is properly connected and/or swap the cable with a known
good cable. If the problem continues:
2.) Run the GFI tests to determine if the GFI is faulty. See:
7-5-8-3 "GFI" on page 7-37
.
Name: I/O Board GFI Temperature Test
Description: Reads temperature sensors on the GFI board and compares the values against specified
limits.
Run Time: 0:05
If this test failed:
1.) Verify that the BEP to Backplane cable is properly connected and/or swap the cable with a known
good cable. If the problem continues:
2.) Check the Front End card rack cooling fans.
3.) Run the GFI Tests to determine if the GFI is faulty. See:
7-5-8-3 "GFI" on page 7-37
.
Name: I/O Board Self Test
Description: The processor on the I/O Board performs a check of its basic functions.
Run Time: 00:01
If this test failed:
1.) Verify that the BEP to Backplane cable is properly connected and/or swap the cable with a known
good cable. If the problem continues:
2.) Replace the I/O Board.