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GR716-DS-UM, May 2019, Version 1.29
84
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GR716
7.3.3
System configuration register
This register can be used to test system, change system error behavior or enable special system func-
tions e.g. interface loopback functionality or to enable external voltage refernce.
The interrupt test is accessible to the system in all functional modes. Protection scheme has been
added to the interrupt test functionality in order to prevent erroneous accesses to the functionality. The
generated interrupt event will be inserted into the interrupt controller and the intention is to test inter-
rupt controller and interrupt software.
The interrupt test control register contains a interrupt number bit field and two protection bits. The
two protection bits are used as protection and enable bits for the interrupt test. When the protection
bits are toggled an interrupt event is asserted to the interrupt controller.
15: 14
Trace Memory on MAIN AHB bus (DSU0 - DSU5):
0x0 - No error detected during last test (If test has been run)
0x1 - Enable March C- test algorithm
0x2 - Error during last scan
0x3 - Invalid state and test result
13: 12
11: 10
9: 8
7: 6
5: 4
3: 2
LEON3FT register Window 1 memory (RW1):
0x0 - No error detected during last test (If test has been run)
0x1 - Enable March C- test algorithm
0x2 - Error during last scan
0x3 - Invalid state and test result
1: 0
LEON3FT register Window 0 memory (RW0):
0x0 - No error detected during last test (If test has been run)
0x1 - Enable March C- test algorithm
0x2 - Error during last scan
0x3 - Invalid state and test result
Table 65.
Interrupt test configuration register
AMBA address
Register
Acronym
0x8000E000
Configuration register for memory test, LVDS reference
and Main bus configuration
SYS.CFG.SCFG
Table 66.
0x8000E000 - SYS.CFG.SCFG - Interrupt test configuration register
31
21 20
18 17 16 15 14 13 12 11 10
9
8
3
2
1
0
R
VREF
SPW
LL
LS
LE FS
PR
IRQ
MR WE EE
0x0
0x0
0x0
0x0
0x0
0x0 0x0
0x0
0x0
0x0 0x0 0x0
r
rw
rw
rw
rw
rw rw
rw
rw
rw rw rw
31: 18
Not used
20: 18
Enable and control of external voltage reference
Bit #20 - Enable external voltage reference
Bit #19 - Input external voltage reference (Only for test purpose during production)
Bit #18 - Bypass buffer, this bit should normally be set to 0 in order to get a full scale ADC reference output.
To enable and output a reference for precision measurements using internal ADC set VREF bits to 100b.
Table 64.
0x8000E004 - SYS.STAT.MEMTEST - Memory test status register