Keysight 5500, Руководство пользователя

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Additional Imaging Modes
5
Keysight 5500 SPM User’s Guide 5-17
For the MAC III controller these connections are made in software.
To image in Force Modulation Mode:
1
First follow the steps from Chapter 4
a
Insert the nose assembly into the scanner.
b
Insert a probe into the nose assembly.
c
Place the scanner in the microscope base.
d
Align the laser on the cantilever.
e
Insert and align the detector.
f
Prepare the sample and place it on the sample plate.
g
Configure the cable connections for MAC as described in
Figure A-3 on page 4.
h
Adjust the video system to focus on the cantilever.
2
Choose Controls > Setup > Components , then select the Serial
Port AC Mode Controller check box. The system will now use the
signal from the MAC (or MAC III) controller.
3
In PicoView choose Mode > Contact . Or, if you are using a MAC
III controller, choose Mode > Force Modulation .
4
Press the Close switch on the HEB to raise the sample until the tip is
close to, but not touching, the sample.
5
Use the video system to bring the tip and sample close to contact:
a
Bring the cantilever into sharp focus.
b
Lower the focal plane just slightly below the tip by turning the
Focus control toward you until the tip is slightly out of focus.
c
Using the Close switch on the HEB, raise the sample until the
sample and tip both come nearly into focus. The tip should now
be just above the sample surface.
6
Locate the area of interest on the sample by performing a scan.
7
In PicoView’s Servo window, enter a Setpoint value slightly greater
than the current Deflection reading (from the HEB front panel or
PicoView’s Laser Alignment window).
8
Click the Approach button. The system will raise the sample until
the deflection reaches the Setpoint value.
9
Now set up the additional AC oscillation:
a
Choose Controls > AC Mode to open the ACAFM Controls
window.
b
Set the Drive Mechanism to AAC .
c
Set the Drive % to 10 %.
d
Set the Frequency to 20-50 kHz.