218
About Measurement Times and Measurement Speed
When the contact check is enabled, the contact check time will be added to the analog measure
-
ment times listed on the previous page.
Contact check
Contact check timing
Contact check time
BEFORE
5.5 ms
AFTER
5.5 ms
BOTH
10 ms
•
When using the external trigger setting, 500 µs is added to the "Analog measurement signal (INDEX)"
(p. 217) when the conditions outlined in the following table apply:
External trigger
Range
Low Z high
accuracy mode
Measure-
ment level
Measurement
frequency
DC bias
Added
time
100 m
Ω
, 1
Ω
OFF
All level
DC, all frequency
OFF
500 µs
100 m
Ω
, 1
Ω
ON
0.01 to 1 V
DC, all frequency
OFF
500 µs
10
Ω
OFF
0.01 to 1 V
DC, 4 Hz to 1 MHz
OFF
500 µs
Measurement times (E
________
OM)
Measurement times= I
____________
NDEX+A+B+C+D+E
A: Calculation time (no OPEN/SHORT/LOAD correction, HOLD range, no screen display, normal
measurement
*
Measurement speed
Calculation time
FAST
All frequencies 0.5 ms
MED
SLOW
SLOW2
*: Times are given for measurement while not using the comparator function or BIN function.
B: OPEN/SHORT/LOAD correction time
OPEN/SHORT/LOAD correction
Correction time
Disabled
0.0 ms
Enabled
MAX 0.4 ms
C: Judgment time
Judgment mode
Judgment time
Disabled (normal measurement
*
)
0.0 ms
Comparator measurement
MAX 0.4 ms
BIN measurement
MAX 0.8 ms
*: Times are given for measurement while not using the comparator function or BIN function.
Содержание IM3536
Страница 20: ...16 Operating Precautions ...
Страница 34: ...30 Screen Layout and Operation ...
Страница 140: ...136 Testing the System Self diagnosis ...
Страница 224: ...220 About Measurement Times and Measurement Speed ...
Страница 240: ...236 Discarding the Instrument ...
Страница 254: ...Appx 14 Dimensional Diagram Appx 10 Dimensional Diagram 230 114 15 48 33 33 25 35 119 1 330 1 Unit mm ...
Страница 264: ...Appx 24 Device Compliance Statement ...
Страница 270: ...Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com ...