Hioki IM3536, Инструкция по эксплуатации

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Example Measurement Timing (Timing Charts)
Timing chart interval descriptions
Interval Description
Time
(Approx.)
t1 From Comparator, BIN Judgement Result to EOM (LO): Setting value for de -
lay time
*1
(p. 181.)
40 µs
t2 From EOM
―――
width (LO) to TRIG
― ― ― ―
(LO): Minimum time from end of measurement
to next trigger *2
400 µs
t3 From TRIG
― ― ― ―
(LO) to INDEX
― ――― ―
(HI): Time from trigger to circuit response
*3
400 µs
t4 INDEX
― ――― ―
width (HI): Analog measurement time (=Minimum chuck time), switch -
ing chuck with INDEX
― ――― ―
(LO) is possible *4
1 ms
t5 EOM
―――
width (HI): Measurement time*4 1.7 ms
t6 From TRIG
― ― ― ―
width (LO) to LD-VALID
― ―― ― ― ― ―
(HI), CALIB
―― ― ― ―
(HI): Time to panel load ex -
ecution and DC adjustment request signal detection
At least t3
t7 Trigger pulse width (LO time) At least 100 µs
t8 Trigger off (HI time) At least 100 µs
*1: There is an approximate error of 100 µs in the delay time entered for Judgement Result↔ EOM
―――
for the set -
ting value. t1 is the reference value for when the setting value is 0.0000 s.
*2: t2 is the reference value for when trigger input for during measurement is disabled (p. 182).
*3: When the panel number is read by the panel load function, the response time is as shown in the table below.
Measurement
mode
Save type for
loaded data
Content of loaded data Response time
LCR
LCR+ADJ Both measurement conditions and correction values Approx. 6.5 ms
LCR
Measurement conditions and cable length correction
setting
Approx. 5 ms
ADJ
Open correction, short correction, load correction,
and correlation correction (scaling) settings and cor-
rection values only
Approx. 1.5 ms
The trigger synchronization delay, trigger delay, and DC delay times are added to t3. When using the "External
trigger" (p. 218) condition , 500 µs is added to t3.
*4: Reference value for Measurement frequency: 1 kHz, Measurement speed: FAST, Range: HOLD (p. 217)
• Because the speed with which the comparator and BIN judgment results rise (LO → HI) varies with the
architecture of the circuit connected to EXT I/O, using the judgment results level immediately after EOM
―――
output may result in an erroneous detection. To prevent this phenomenon, set a delay time (t1) between
judgment result output and EOM
―――
output.
In addition, by configuring the instrument so that the judgment result signal at EXT I/O is reset at the same
time as the measurement start signal (thereby forcing the judgment results to transition to HI at the same
time as TRIG
― ― ― ―
input [ EOM
―――
{HI}]), the transition from LO to HI when the judgment results are output after
the completion of measurement can be eliminated. As a result, the delay time set between judgment result
output and EOM
―――
output can be minimized. However, be careful because the judgment result confirmation
interval is until the next trigger is accepted.
• When inputting the trigger from EXT I/O or communicating using one of the instrument’s interfaces dur -
ing measurement, variability in the delay time between output of comparator and BIN judgment results
and EOM
―――
output may increase. Consequently, control of the instrument from an external device should be
avoided during measurement to the greatest extent possible.
Setting on the instrument:
See "Setting the delay time (from judgment result output to EOM output) and judgment result reset opera -
tion" (p. 181).
Setting with a communications command:
See LCR Application Disc - Communications Command (
:IO:OUTPut:DELay
), (
:IO:RESult:RESet
).