Chapter 6
DS0 DDS Test Commands
Description of DDS test commands
60
CT-650 Command-Line Reference Guide
Release 9.4
Description of DDS test commands
This section describes the DS0 DDS commands.
DDS_DI_Measure
Executes an intrusive drop and insert test on the chosen side of the
circuit under test.
Syntax
DDS_DI_Measure <
> <
>
<
> <
Remarks
– This command is available only after executing a
DDS_DI_Split
command.
– Not all
test_pattern_types
require a
test_pattern
param-
eter.
DDS_DI_Split
Establishes an intrusive connection between the monitored TAP from
a 3/1 DCS and a DTU RTU.
Syntax
DDS_DI_Split <
Remarks
– This command is available only after executing a
DI_Monitor
command.
– This command establishes an EF split on the selected DS0
channel.
– An AB split is established across the DS1 signal with the selected
DS0 channel configured in an EF split.
DDS_Measure
Executes an intrusive test on the chosen side of the circuit under test.
Syntax
DDS_Measure <
> <
<
> <
Summary of Contents for CT-650
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