Appendix A
Test Results Definitions
DS1 results
CT-650 Command-Line Reference Guide
Release 9.4
143
Logic
The following fields appear in the Logic category of the DS1 test
results screens.
Field
Description
Bit Errors
Number of received pattern bits that have a value
opposite that of the corresponding transmitted pattern
bits since initial pattern synchronization. For example,
if 1010 was transmitted, and 1100 was received, two
bit errors occurred.
Bit Err
Rate
Ratio of pattern bit errors to received pattern bits since
initially acquiring pattern synchronization.
Bit Err Sec
Number of seconds during which one or more pattern
bit errors occurred since initial pattern synchroniza-
tion.
Block
Errors
Number of received blocks (100 bits) with one or more
logical bit errors.
Block Error
Rate
Ratio of block errors to received blocks since initial
DS1 pattern synchronization.
Pattern
Losses
Number of times pattern synchronization was lost
since initial pattern synchronization.
Pattern
Loss Sec-
onds
Number of seconds during which pattern synchroniza-
tion was lost since initial pattern synchronization.
Pattern
Slips
Total number of pattern slips since the beginning of the
test. When a slip is detected, the CT-650 automatically
resynchronizes to the received pattern. However, pat-
tern bit errors are not suppressed during this process.
Pattern slips are available only when using pseudo-
random patterns.
Summary of Contents for CT-650
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