Appendix A
Test Results Definitions
DS0 VF results
166
CT-650 Command-Line Reference Guide
Release 9.4
Terse
The Terse category of the VF test results screens lists the signaling
events that occur during the test. Sequence of signaling events on VF
circuits. Possible values include:
– w - wink
– d - delay dial
– o, O - on hook
– h, H - off hook
– t - dial tone
– G - ground on ring
– P - pause
– R - ring
Verbose
The following fields appear in the Verbose category of the VF test
results screens.
Listen
The following fields appear after entering a Listen command from the
VF Drop & Insert Monitor Menu.
Field
Description
Event
Name of the signaling event.
Delay
Delay between this event and the previous event.
Duration
Duration of an event.
Field
Description
Volume
Volume of the received signal.
Listen Src
Device to which the listen test is connected.
Summary of Contents for CT-650
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