Appendix A
Test Results Definitions
DS3 results
128
CT-650 Command-Line Reference Guide
Release 9.4
Logic
The following fields appear in the Logic category of the DS3 test
results screens.
RX X-Bits
Current status of the received X-bits when in a framed
mode. The result is available after receiving DS3
frame synchronization.
TX X-Bits
Current setting of the transmitted X-bits when in a
framed mode.
Field
Description
Field
Description
Bit Errors
Number of received pattern bits that have a value
opposite that of the corresponding transmitted pattern
bits since initial pattern synchronization. For example,
if 1010 was transmitted, and 1100 was received, two
bit errors occurred.
Bit Err
Rate
Ratio of pattern bit errors to received pattern bits since
initially acquiring pattern synchronization.
Average Bit
Err Rate
Ratio of pattern bit errors to the total number of
received pattern bits while pattern synchronization is
present.
Bit Err Sec
Number of seconds during which one or more pattern
bit errors occurred since initial pattern synchroniza-
tion.
Bit % EFS
Ratio of error-free seconds, expressed as a percent-
age, during which no pattern bit errors were detected
to the total number of seconds since DS3 pattern syn-
chronization.
Summary of Contents for CT-650
Page 1: ...CT 650 Wideband Test Unit Release 9 4 Command Line Reference Guide ...
Page 2: ......
Page 3: ...CT 650 Wideband Test Unit Release 9 4 Command Line Reference Guide ...
Page 4: ......
Page 22: ...Contents xxii CT 650 Command Line Reference Guide Release 9 4 ...
Page 240: ...Appendix D Customer Services and Support Training options 214 CT 650 User s Guide Release 9 3 ...
Page 247: ......