Appendix A
Test Results Definitions
DS0 VF results
164
CT-650 Command-Line Reference Guide
Release 9.4
TYPE
Status of the test. Possible values are
ABORTED
,
COM-
PLETE
,
MEASURE
, and
MONITOR
.
SIDE
Side of the cross-connect being tested. Possible val-
ues are as follows:
–
CON
Connected side of selected digroup being
tested from
Monitor
command.
–
CON/B
Connected side of digroup being tested
from an AB split.
–
CON/F
Connected side of digroup being tested
from an EF split.
–
N/A
This field is not applicable to the current test
(DS1 direct tests and selftest).
–
SEL
Selected side of digroup being tested from
Monitor
command.
–
SEL/A
Selected side of digroup being tested from
an A split or AB split.
–
SEL/B
Selected side of digroup being tested from
a B split.
–
SEL/E
Selected side of digroup being tested from
an E split or EF split.
–
SEL/F
Selected side of digroup being tested from
an F split.
E. TIME
Elapsed time since the test started.
TAP
DS0 test access path being used (1 to 12).
EC
State of the echo canceller.
CH
Number of the DS0 channel under test (1 to 24).
Field
Description
Summary of Contents for CT-650
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