Appendix A
Test Results Definitions
DS1 results
CT-650 Command-Line Reference Guide
Release 9.4
135
TYPE
Status of the test. Possible values are
ABORTED
,
COM-
PLETE
,
MEASURE
, and
MONITOR
.
SIDE
Side of the cross-connect being tested. Possible val-
ues are as follows:
–
CON
Connected side of selected digroup being
tested from
Monitor
command.
–
CON/B
Connected side of digroup being tested
from an AB split.
–
CON/F
Connected side of digroup being tested
from an EF split.
–
N/A
This field is not applicable to the current test
(DS1 direct tests and selftest).
–
SEL
Selected side of digroup being tested from
Monitor
command.
–
SEL/A
Selected side of digroup being tested from
an A split or AB split.
–
SEL/B
Selected side of digroup being tested from
a B split.
–
SEL/E
Selected side of digroup being tested from
an E split or EF split.
–
SEL/F
Selected side of digroup being tested from
an F split.
TX FRM
Type of framing being transmitted. Examples include
D4
,
C-BIT
,
UNFRAMED
, or
N/A
.
UNDEFINED
appears if
the CT-650 cannot determine the framing.
TX PAT
Pattern transmitted by the RTU.
E. TIME
Elapsed time since the test started.
Field
Description
Summary of Contents for CT-650
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