Appendix A
Test Results Definitions
DS0 DDS results
156
CT-650 Command-Line Reference Guide
Release 9.4
SIDE
Side of the cross-connect being tested. Possible val-
ues are as follows:
–
CON
Connected side of selected digroup being
tested from
Monitor
command.
–
CON/B
Connected side of digroup being tested
from an AB split.
–
CON/F
Connected side of digroup being tested
from an EF split.
–
N/A
This field is not applicable to the current test
(DS1 direct tests and selftest).
–
SEL
Selected side of digroup being tested from
Monitor
command.
–
SEL/A
Selected side of digroup being tested from
an A split or AB split.
–
SEL/B
Selected side of digroup being tested from
a B split.
–
SEL/E
Selected side of digroup being tested from
an E split or EF split.
–
SEL/F
Selected side of digroup being tested from
an F split.
TX FRM
Type of framing being transmitted. Examples include
D4
,
C-BIT
,
UNFRAMED
, or
N/A
.
UNDEFINED
appears if
the CT-650 cannot determine the framing.
TX PAT
Pattern transmitted by the RTU.
E. TIME
Elapsed time since the test started.
RX FRM
Type of framing detected by the receiver. If the
detected framing does not match the selected framing,
this field appears as white text on a black background.
Possible framing formats include:
–
C-bit
DS3 C-bit framed signal detected.
–
M13
DS3 M13 framed signal detected.
–
N/A
No signal is detected.
–
UNFRAMED
Unframed DS3 signal detected.
Field
Description
Summary of Contents for CT-650
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